Robustness in automotive electronics: An industrial overview of major concerns
- Resource Type
- Conference
- Authors
- Backhausen, U.; Ballan, O.; Bemardi, P.; De Luca, S.; Henzler, J.; Kern, T.; Piumatti, D.; Rabenalt, T.; Ramamoorthy, K.C.; Sanchez, E.; Sansonetti, A.; Ullmann, R.; Venini, F.; Wiesner, R.
- Source
- 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) On-Line Testing and Robust System Design (IOLTS), 2017 IEEE 23rd International Symposium on. :157-162 Jul, 2017
- Subject
- Components, Circuits, Devices and Systems
Computing and Processing
Safety
Robustness
Software
Circuit faults
Automotive engineering
Error correction codes
Libraries
ISO 26262
Functional Safety
SoC On-Line Self-Test
Memory Repair
Security
- Language
- ISSN
- 1942-9401
Different perspectives about the concept of Robustness in Automotive Electronic are provides by leading edge semiconductor manufacturer. Xilinx contribution is related to the development and evaluation of Software Test Libraries suitable for in-field testing of the interconnect blocks in large SoCs. Infineon (IFX) section is discussing safety and security concerns of On-Line FLASH Memory Repair. STMicroelectronics is providing guidelines for the development and integration of Core Self-Test libraries.