Stability of Schottky Barrier Diode Integrated in p-GaN Enhancement-mode GaN Power Technology
- Resource Type
- Conference
- Source
- 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2021 IEEE International Symposium on the. :1-6 Sep, 2021
- Subject
Components, Circuits, Devices and Systems Computing and Processing Engineered Materials, Dielectrics and Plasmas Photonics and Electrooptics Power, Energy and Industry Applications Schottky diodes Schottky barriers Voltage Switches HEMTs Logic gates Stability analysis GaN Monolithic Integration Schottky Barrier Diode p-GaN HEMTs - Language
- ISSN
- 1946-1550