Measurement of neutron-induced single event transient pulse width narrower than 100ps
- Resource Type
- Conference
- Authors
- Nakamura, Hideyuki; Tanaka, Katsuhiko; Uemura, Taiki; Takeuchi, Kan; Fukuda, Toshikazu; Kumashiro, Shigetaka
- Source
- 2010 IEEE International Reliability Physics Symposium Reliability Physics Symposium (IRPS), 2010 IEEE International. :694-697 May, 2010
- Subject
- Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Fields, Waves and Electromagnetics
Power, Energy and Industry Applications
Pulse measurements
Space vector pulse width modulation
Pulse circuits
Particle beams
Pulse width modulation inverters
Circuit simulation
Error correction codes
Latches
Databases
Circuit testing
SET
single event transient
neutron
combinational logic
SEE
single event effects
soft errors
- Language
- ISSN
- 1541-7026
1938-1891
A novel SET pulse measurement circuit is proposed which can detect pulses narrower than 100ps. Alternation of SET pulses during the propagation through the chain of target cells is minimized, which is attributed to small chain length (typically 20). This circuit configuration contributes to obtaining pulse distribution similar to that observed in actual circuit in use. Distribution of SET pulse width measured by our circuit through the white neutron beam testing agrees well with that estimated by computer simulation.