Analysis of Charge Trap Depth Using Q(t) Method and Quantum Chemical Calculation in XLPE and PE with Phenolic Antioxidant
- Resource Type
- Conference
- Authors
- Uehara, H.; Okamoto, T.; Sekii, Y.; Iwata, S.; Takada, T.
- Source
- 2021 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) Electrical Insulation and Dielectric Phenomena (CEIDP), 2021 IEEE Conference on. :454-457 Dec, 2021
- Subject
- Engineered Materials, Dielectrics and Plasmas
Power, Energy and Industry Applications
Resistance
Electron traps
Insulation
Polyethylene
Dielectrics
Electrical resistance measurement
Electric fields
- Language
- ISSN
- 2576-2397
Measurements using the direct current integrated charge method (Q(t) method) revealed that the low-density polyethylene with phenolic antioxidants (LDPE+AO) sample had higher electric field characteristics and heat resistances than the cross-linked polyethylene (XLPE) sample. In this study, we analyzed the high electric field characteristics and heat resistance of the LDPE+AO sample from the standpoint of charge trap depth using molecular dynamics (MD) simulation and quantum chemical calculation. The results showed that AO addition was involved in the formation of deep charge traps.