Resistivity and mu-tau imager for automatic characterization of semiconductor materials
- Resource Type
- Conference
- Source
- 2011 IEEE Nuclear Science Symposium Conference Record Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2011 IEEE. :4829-4832 Oct, 2011
- Subject
Nuclear Engineering Bioengineering Communication, Networking and Broadcast Technologies Components, Circuits, Devices and Systems Computing and Processing Signal Processing and Analysis Time measurement Software measurement Materials Indium Indexes Conductivity Software Semiconductor materials Crystals characterization Material uniformity Resistivity and mu-tau product mapping - Language
- ISSN
- 1082-3654