Characterization of X- and Gamma- ray CdTe radiation detectors
- Resource Type
- Conference
- Authors
- Raulo, A.; Sowinska, M.; Hennard, G; Campajola, L.; Marano, D.; Paternoster, G; Perillo, E.
- Source
- 2011 IEEE Nuclear Science Symposium Conference Record Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2011 IEEE. :4795-4798 Oct, 2011
- Subject
- Nuclear Engineering
Bioengineering
Communication, Networking and Broadcast Technologies
Components, Circuits, Devices and Systems
Computing and Processing
Signal Processing and Analysis
Annealing
Radio access networks
Surface treatment
Plasma measurements
Spectroscopy
Metals
CdTe Growth
CdTe characterization
Detectors
Defects
Diffusion processes
Ionizing radiation
Particle beam measurements
Semiconductor materials
X-ray spectroscopy
- Language
- ISSN
- 1082-3654
CdTe crystals grown by the Traveling Heater Method (THM) often show a pronounced non-uniformity along the ingots due to the thermal irregularities, the Te-excess growth conditions resulting from the retrograde slope of the solidus line of the phase diagram, and to the introduced impurities. In addition, structural defects can be present that affect the electrical and optical properties of the crystals.