Using industry-grade test equipment in a digital test and product engineering lab course
- Resource Type
- Conference
- Authors
- Miller, Christopher; Hudson, Tina A.; Sipes, Shannon
- Source
- 2015 IEEE International Conference on Microelectronics Systems Education (MSE) Microelectronics Systems Education (MSE), 2015 IEEE International Conference on. :13-16 May, 2015
- Subject
- Components, Circuits, Devices and Systems
Computing and Processing
Testing
Circuit faults
Microcontrollers
Random access memory
Timing
Industries
Programming
digital systems
test engineering
labs
hands-on learning
critical thinking skills
embedded systems testing
- Language
This paper presents a new digital test and product engineering course targeted to undergraduate seniors and master's-level graduate students. Through industrial guided labs, students were able to gain hands-on experience using an industry-grade automatic tester (ATE). Students indicated that the course provided an integration of many of the concepts from their digital core courses, and contributed to the development of skills essential to careers in test engineering or elsewhere.