Crystallographic orientation analysis of magnetite thin films by means of electron backscatter diffraction (EBSD)
- Resource Type
- Conference
- Authors
- Koblischka-Veneva, A. D.; Koblischka, M. R.; Muecklich, F.; Murphy, S.; Zhou, Y.; Shvets, I. V.
- Source
- INTERMAG 2006 - IEEE International Magnetics Conference Magnetics Conference, 2006. INTERMAG 2006. IEEE International. :989-989 May, 2006
- Subject
- Fields, Waves and Electromagnetics
Crystallography
Magnetic analysis
Transistors
Electrons
Backscatter
Diffraction
Iron
Substrates
Molecular beam epitaxial growth
Annealing
- Language
- ISSN
- 2150-4598
2150-4601
Fe 3 O 4 [001] thin films is grown on MgO[001] substrates using oxygen-plasma-assisted molecular beam epitaxy and annealed in air at 250 degC. Automated EBSD scans is performed twice to study the crystallographic orientation by means of recording of Kikuchi patterns.