A Novel Propagation Model for Heavy-Ions Induced Single Event Transients on 65nm Flash-based FPGAs
- Resource Type
- Conference
- Authors
- Du, B.; Colucci, M.; Francola, S.; Aranci, L.; Artina, E.; Ratti, N.; Picardi, E.; Mancini, R.; Piloni, V.; Azimi, S.; Sterpone, L.
- Source
- 2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Radiation and Its Effects on Components and Systems (RADECS), 2020 20th European Conference on. :1-4 Oct, 2020
- Subject
- Aerospace
Components, Circuits, Devices and Systems
Photonics and Electrooptics
Single event transients
Analytical models
Europe
Integrated circuit modeling
Circuit analysis
Field programmable gate arrays
Heavy Ions
Single Event Transients
Propagation Induced Pulse Broadening
- Language
- ISSN
- 1609-0438
We present a SET generation and propagation model based on Hann-smoothing function for 65nm Flash-based FPGAs. The model has been characterized with heavy-ions radiation campaigns demonstrating its viable usage for circuit analysis and mitigation purposes.