Optical Characterization of Thin Film CuxAlOy in the CdTe Device Configuration
- Resource Type
- Conference
- Authors
- Subedi, Indra; Subedi, Kamala Khanal; Dulal, Prabin; Phillips, Adam B.; Heben, Michael J.; Ellingson, Randy J.; Podraza, Nikolas J.
- Source
- 2022 IEEE 49th Photovoltaics Specialists Conference (PVSC) Photovoltaics Specialists Conference (PVSC), 2022 IEEE 49th. :0774-0777 Jun, 2022
- Subject
- Aerospace
Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Photonics and Electrooptics
Power, Energy and Industry Applications
Photovoltaic systems
II-VI semiconductor materials
Photonic band gap
Photovoltaic cells
Glass
Optical films
Optical devices
Copper aluminum oxide
optical properties
thin film
CdTe
spectroscopic ellipsometry
- Language
Optical properties and band gap energy of solution processed p-type transparent Cu x AlO y thin film deposited on sodalime glass are determined using spectroscopic ellipsometry. This is a promising material for a p-type transparent back contact and passivation layer for thin film CdTe based solar cells. The direct optical band gap obtained from Tauc plot is found to be $3.64 \pm 0.01\ \text{eV}$. Further characterization is also done with this layer in the CdTe / CdS device stack. Cu x AlO y conformally coats and smoothens the CdTe surface on the CdTe / CdS device stack indicating improved surface quality and surface passivation.