Operational Risk in Semiconductor Fabrication Using Binary Classification Algorithms and Monte Carlo Simulation, a Systemic Review
- Resource Type
- Conference
- Authors
- Patnaik, Debasis; R, Sudhir P; Suresh, Dhruv
- Source
- 2022 Interdisciplinary Research in Technology and Management (IRTM) Technology and Management (IRTM), 2022 Interdisciplinary Research in. :1-6 Feb, 2022
- Subject
- Communication, Networking and Broadcast Technologies
Computing and Processing
Engineering Profession
General Topics for Engineers
Power, Energy and Industry Applications
Transportation
Fabrication
Monte Carlo methods
Manufacturing processes
Semiconductor devices
Prediction algorithms
Classification algorithms
Semiconductor fabrication
Operational risk
Binary Classification
Monte Carlo Simulation
- Language
The manufacturing processes involved in the fabrication of semiconductor devices are very prone to error due to its extremely intricate nature. There are several hundred processes and the process of detection of a defect is extremely capital and time consuming. In this paper, we aim to analyze the fabrication process and analyze manufacturing machine data in order to determine the average probability of excursion and the loss associated with these excursions using binary classification prediction algorithms and Monte Carlo simulations.