Analog Circuit Fault Diagnosis Using Multi-wavelet Transform and SVM
- Resource Type
- Conference
- Authors
- Yunyan, Hu; Minfang, Peng; Chenglai, Tian; Hu, Tan
- Source
- 2012 Third International Conference on Digital Manufacturing & Automation Digital Manufacturing and Automation (ICDMA), 2012 Third International Conference on. :214-217 Jul, 2012
- Subject
- Components, Circuits, Devices and Systems
Power, Energy and Industry Applications
Circuit faults
Fault diagnosis
Wavelet transforms
Analog circuits
Support vector machine classification
fault diagnosis
analog circuit
multi-wavelet transform
SVM
- Language
A new method for diagnosing analog circuit faults using multi-wavelet transform and support vector machine (SVM) is presented. The response signals of the analog circuit are preprocessed using multi-wavelet transform and the optimal fault feature with better classification capacity are obtained using energy normalization. Then, the features are inputted into the ensemble SVM to identify different fault cases. Simulation results indicate that this method can effectively enhance the analog fault diagnostic accuracy.