A study of single event effects induced by heavy charged particles in 180 nm SoI technology
- Resource Type
- Conference
- Source
- 2018 IEEE Nuclear Science Symposium and Medical Imaging Conference Proceedings (NSS/MIC) Nuclear Science Symposium and Medical Imaging Conference Proceedings (NSS/MIC), 2018 IEEE. :1-4 Nov, 2018
- Subject
Bioengineering Components, Circuits, Devices and Systems Nuclear Engineering Photonics and Electrooptics Ions Radiation effects Detectors Atmospheric measurements Particle measurements Temperature measurement Shift registers - Language
- ISSN
- 2577-0829