New Circuit Topology for System-Level Reliability of GaN
- Resource Type
- Conference
- Source
- 2019 31st International Symposium on Power Semiconductor Devices and ICs (ISPSD) Power Semiconductor Devices and ICs (ISPSD), 2019 31st International Symposium on. :299-302 May, 2019
- Subject
Components, Circuits, Devices and Systems Power, Energy and Industry Applications Acceleration Gallium nitride Reliability Stress Switches Power demand Vehicle dynamics GaN MTTF System Lifetime - Language
- ISSN
- 1946-0201