Advanced condition monitoring system based on on-line semiconductor loss measurements
- Resource Type
- Conference
- Authors
- Krone, Tobias; Dang Hung, Lan; Jung, Marco; Mertens, Axel
- Source
- 2016 IEEE Energy Conversion Congress and Exposition (ECCE) Energy Conversion Congress and Exposition (ECCE), 2016 IEEE. :1-8 Sep, 2016
- Subject
- Power, Energy and Industry Applications
Transportation
Voltage measurement
Loss measurement
Temperature measurement
Semiconductor device measurement
Current measurement
Field programmable gate arrays
Junctions
- Language
This paper presents an FPGA-based on-line condition monitoring system integrated at gate-driver voltage level. The system uses the change of on-state voltage and thermal resistance as ageing indicators. The monitoring is realized by implementing an on-line semiconductor power loss measurement system for switching and on-state losses and a thermal model of the module. Apart from the concept, its practical implementation is described, and the experimental results are given.