On-line semiconductor switching loss measurement system for an advanced condition monitoring concept
- Resource Type
- Conference
- Authors
- Krone, Tobias; Dang Hung, Lan; Jung, Marco; Mertens, Axel
- Source
- 2016 18th European Conference on Power Electronics and Applications (EPE'16 ECCE Europe) Power Electronics and Applications (EPE'16 ECCE Europe), 2016 18th European Conference on. :1-10 Sep, 2016
- Subject
- Aerospace
Components, Circuits, Devices and Systems
Power, Energy and Industry Applications
Robotics and Control Systems
Transportation
Current measurement
Voltage measurement
Switches
Field programmable gate arrays
Semiconductor device measurement
Insulated gate bipolar transistors
Switching loss
Switching losses
Current sensor
Diagnostics
Reliability
IGBT
Wind energy
- Language
In this paper, an FPGA-based on-line switching loss measurement system for an advanced condition monitoring system is presented. For this purpose, an on-line measurement system for the semiconductor voltage and current transients integrated at the gate-driver voltage level is proposed. This system and the switching loss calculations are verified by experimental results.