Evaluation of Code Selective Histogram Algorithm For ADC Linearity Test
- Resource Type
- Conference
- Authors
- Zhao, Yujie; Katoh, Kentaroh; Kuwana, Anna; Katayama, Shogo; Iimori, Daisuke; Ozawa, Yuki; Nakatani, Takayuki; Hatayama, Kazumi; Kobayashi, Haruo; Sato, Keno; Ishida, Takashi; Okamoto, Toshiyuki; Ichikawa, Tamotsu
- Source
- 2022 IEEE International Conference on Consumer Electronics-Asia (ICCE-Asia) Consumer Electronics-Asia (ICCE-Asia), 2022 IEEE International Conference on. :1-4 Oct, 2022
- Subject
- Aerospace
Communication, Networking and Broadcast Technologies
Computing and Processing
Engineering Profession
Fields, Waves and Electromagnetics
Geoscience
Photonics and Electrooptics
Power, Energy and Industry Applications
Robotics and Control Systems
Signal Processing and Analysis
Transportation
Histograms
Codes
Simulation
Linearity
Harmonic analysis
Registers
Consumer electronics
SAR ADC
Linearity Test
Histogram Method
Two-Tone
Code Selective Algorithm
- Language
This paper evaluates our previously proposed code selective histogram method with multi-tone input signal for the short-time accurate linearity testing of the ADC in consumer electronic products. Our code selective histogram method with two-tone sine wave for the SAR ADC test is taken up as an example and evaluated precisely, to test the linearity for specific vulnerable codes. Using only one harmonic component is a good point of two-tone sine wave input method. We have derived an explicit algorithm to obtain DNL and INL from the histogram data with multi-tone input. Then we have developed a program to validate our algorithm, and our simulation results show that the effectiveness and performance of the code selective histogram method.