Absorptive thin film characterization with spectroscopic full-field optical coherence tomography
- Resource Type
- Conference
- Authors
- Ho, Tuan-Shu; Tsai, Chien-Chung; Hsu, Kuang-Yu; Huang, Sheng-Lung
- Source
- CLEO: 2013 Lasers and Electro-Optics (CLEO), 2013 Conference on. :1-2 Jun, 2013
- Subject
- Photonics and Electrooptics
Optical films
Optical refraction
Optical variables control
Refractive index
Optical reflection
Coherence
Tomography
- Language
- ISSN
- 2160-8989
We have developed a spectroscopic full-field optical coherence tomography system, which can provide an ultrahigh isotropic spatial resolution. The complex refractive index and thickness of an embedded absorptive thin film was simultaneously measured.