Issues of Using Unsaturated Heating Time for Transient Thermal Measurement
- Resource Type
- Conference
- Authors
- Hara, Tomoaki; Fukunaga, Shuhei; Funaki, Tsuyoshi
- Source
- 2023 International Conference on Electronics Packaging (ICEP) Electronics Packaging (ICEP), 2023 International Conference on. :191-192 Apr, 2023
- Subject
- Communication, Networking and Broadcast Technologies
Components, Circuits, Devices and Systems
Photonics and Electrooptics
Power, Energy and Industry Applications
Signal Processing and Analysis
Heating systems
Semiconductor device measurement
Cooling
Thermal resistance
Time measurement
Electrical resistance measurement
Transient analysis
Transient Thermal Measurement
Structure Function
Thermal Capacitance
Thermal Resistance
SPICE
- Language
"Heating time must be long enough to reach the thermal static equilibrium." This is a basic rule for transient thermal measurement of semiconductor devices. However, there are some situations when it is difficult to follow the rule. In this paper, the issues when violating the rule is discussed. The best measurement time setting with the limited total transient thermal measurement time will be discussed as well.