Single-Event Upset (SEU) in a Dram with On-Chip Error Correction
- Resource Type
- Periodical
- Authors
- Zoutendyk, J. A.; Schwartz, H. R.; Watson, R. K.; Hasnain, Z.; Nevill, L. R.
- Source
- IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 34(6):1310-1315 Dec, 1987
- Subject
- Nuclear Engineering
Bioengineering
Single event upset
Error correction
Error correction codes
Random access memory
MOS capacitors
Iron
Computer errors
MOS devices
Propulsion
Laboratories
- Language
- ISSN
- 0018-9499
1558-1578
The results are given of the first SEU measurements ever reported on IC devices with on-chip error correction. This method of SEU abatement could revolutionize the design of SEU-immune electronic systems.