11.6: Emission characterization of diamond current amplifier
- Resource Type
- Conference
- Authors
- Yater, Joan E.; Shaw, Jonathan L.; Jensen, Kevin L.; Myers, Robert E.; Butler, James E.; Pate, Bradford B.; Feygelson, Tatyana
- Source
- 2010 IEEE International Vacuum Electronics Conference (IVEC) Vacuum Electronics Conference (IVEC), 2010 IEEE International. :211-212 May, 2010
- Subject
- Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Fields, Waves and Electromagnetics
Electron emission
Energy measurement
Optical reflection
Optical films
Gain measurement
Conductive films
Cathodes
Laboratories
Chemistry
Electron beams
secondary emission
diamond
current amplifier
negative electron affinity
electron transport
- Language
Secondary-electron-emission measurements are used to examine the transport and emission characteristics of an 8.3-micron-thick diamond amplifier film. Superior transport and emission properties are confirmed for the single-crystal CVD diamond compared to previously-studied polycrystalline diamond. In particular, low-energy secondary electrons are emitted from the conduction band even after diffusing through the entire 8-micron-thick film. In the initial field-free measurements, the gain is limited by diffusive transport but it should increase greatly upon biasing the amplifier.