High-Q dielectric resonator with operated slit (Tunability, Thermal Stability, Film Measurements)
- Resource Type
- Conference
- Authors
- Eremenko, A.; Shmigin, D.; Pashkov, V.; Molchanov, V.; Poplavko, Y.
- Source
- IEEE MTT-S International Microwave Symposium Digest, 2005. Microwave Symposium Microwave Symposium Digest, 2005 IEEE MTT-S International. :1075-1078 2005
- Subject
- Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Fields, Waves and Electromagnetics
Aerospace
Communication, Networking and Broadcast Technologies
Photonics and Electrooptics
Thermal stability
Dielectric measurements
Thermal expansion
Dielectric devices
Resonance
Resonant frequency
Frequency measurement
Electric variables measurement
Dielectric films
Temperature
- Language
- ISSN
- 0149-645X
Split dielectric resonator (SDR) of H type with a narrow slit located athwart to electric field is presented as: 01δ (1) electro-mechanically tunable DR utilizing fast piezo-actuator; (2) high-Q resonant system with thermal self-stabilization of its resonant frequency using thermal expansion for compensation; (3) measurement device to study dielectric film parameters, including their temperature characteristics. Proposed SDR theoretical analysis based on the combination of partial regions methods and collocations, shows agreement with experimental results