Laser Simulation of SEE Due to Localized Ionization in Dielectric Structures
- Resource Type
- Periodical
- Authors
- Chugg, A. M.; English, R.; Parker, S.; Burnell, A. J.
- Source
- IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 56(1):294-298 Feb, 2009
- Subject
- Nuclear Engineering
Bioengineering
Ionization
Dielectrics
Optical pulse generation
Optical pulses
Pulse amplifiers
Electromagnetic wave absorption
Laser transitions
Microchip lasers
Optical harmonic generation
Testing
lasers
single event effects
ultraviolet radiation effects
- Language
- ISSN
- 0018-9499
1558-1578
This paper reports an investigation of the use of Two-Photon Absorption (TPA) of blue laser pulses and production of ultraviolet pulses through Second Harmonic Generation (SHG) to simulate single event effects involving ionization and charge trapping in dielectrics.