Automatic linearity and frequency response tests with built-in pattern generator and analyzer
- Resource Type
- Periodical
- Authors
- Fa Dai, F.; Stroud, C.; Dayu Yang
- Source
- IEEE Transactions on Very Large Scale Integration (VLSI) Systems IEEE Trans. VLSI Syst. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on. 14(6):561-572 Jun, 2006
- Subject
- Components, Circuits, Devices and Systems
Computing and Processing
Linearity
Frequency response
Automatic testing
Automatic test pattern generation
Test pattern generators
Pattern analysis
Circuit testing
Built-in self-test
Field programmable gate arrays
Synthesizers
Analog integrated circuits
built-in self-test (BIST)
frequency response
inter-modulation
linearity
mixed-signal systems
VLSI testing
- Language
- ISSN
- 1063-8210
1557-9999
We present a built-in self-test (BIST) approach based on a direct digital synthesizer (DDS) for functionality testing of analog circuitry in mixed-signal systems. A main contribution of this paper is the BIST-based hardware implementation and measurement of amplifier linearity (IP3) and frequency response, including both phase and gain. The approach has been implemented in Verilog and synthesized into a field-programmable gate array (FPGA), where it was used for functional testing of an actual device under test (DUT) and compared to simulation results.