Influence of voltage contacts on precision measurements of the quantized Hall resistance: an effect of externally injected current
- Resource Type
- Periodical
- Authors
- Chen, T.P.; Chua, H.A.
- Source
- IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 47(2):592-594 Apr, 1998
- Subject
- Power, Energy and Industry Applications
Components, Circuits, Devices and Systems
Electrical resistance measurement
Contact resistance
Current measurement
Chemical analysis
Voltage measurement
Hall effect
Metallization
Productivity
Standards Board
- Language
- ISSN
- 0018-9456
1557-9662
The influence of the error voltage developed in a nonideal voltage contact by an externally injected current such as the offset current of a nanovolt meter in a four-terminal measurement of the quantized Hall resistance (QHR) has been analyzed, and it was found to be quite significant. Based on the analysis, we have provided some qualitative and even quantitative explanations for the previously reported experimental results by Jeckelmann and Jeanneret on the influence of the voltage contacts on the QHR [1997], which are not explained satisfactorily by the existing theories.