Pulsed Laser Deposition of ${\rm SrRuO}_{3}$ Buffers for Coated Conductor Applications
- Resource Type
- Periodical
- Authors
- Choi, M. R.; Yoon, H. R.; Kim, T. Y.; Lee, J. H.; Jo, W.; Kang, Y. M.; Yoo, S. I.; Oh, Y. S.; Kim, K. H.; Ha, H. S.; Oh, S. S.
- Source
- IEEE Transactions on Applied Superconductivity IEEE Trans. Appl. Supercond. Applied Superconductivity, IEEE Transactions on. 17(2):3451-3454 Jun, 2007
- Subject
- Fields, Waves and Electromagnetics
Engineered Materials, Dielectrics and Plasmas
Pulsed laser deposition
Optical pulses
Transistors
Atomic force microscopy
Sputtering
X-ray lasers
Temperature dependence
X-ray diffraction
Surface morphology
Magnetic analysis
Coated conductors
pulsed laser deposition
%24{%5Crm+SrRuO}%5F{3}%24<%2Ftex><%2Fformula>+buffer+layers%22">${\rm SrRuO}_{3}$ buffer layers
- Language
- ISSN
- 1051-8223
1558-2515
2378-7074
${\rm SrRuO}_{3}$ thin films have been grown in-situ on ${\rm LaAlO}_{3}$ and textured metal templates by pulsed laser deposition. Deposition was carried out between 3 mTorr to 300 mTorr of oxygen partial pressure with laser repetition rate of 5 Hz. Substrate temperature was between 500 and 800 $^{\circ}{\rm C}$. Dependence of out-of plane orientation of ${\rm SrRuO}_{3}$ thin films on pressure and growth temperature is investigated by X-ray diffraction. The surface morphology and grain growth behaviors of ${\rm SrRuO}_{3}$ thin films are analysed by atomic force microscopy. In addition, a ferromagnetic transition at $\sim$150 K of ${\rm SrRuO}_{3}$ films on ${\rm LaAlO}_{3}$ is detected by resistivity and magnetization measurement.