Split ADC background self-calibration of a 16-b successive approximation ADC in 180nm CMOS
- Resource Type
- Conference
- Source
- 2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Instrumentation and Measurement Technology Conference (I2MTC), 2013 IEEE International. :310-313 May, 2013
- Subject
Power, Energy and Industry Applications Calibration Capacitors CMOS integrated circuits Convergence Approximation methods Accuracy Algorithm design and analysis - Language
- ISSN
- 1091-5281