Differential Circuit Characterization with Two-Port S-Parameters
- Resource Type
- Periodical
- Source
- IEEE Microwave Magazine IEEE Microwave Microwave Magazine, IEEE. 7(6):86-99 Dec, 2006
- Subject
Fields, Waves and Electromagnetics Scattering parameters Voltage Impedance matching Radio frequency RF signals Network topology Circuit topology Performance gain Linearity Circuit noise - Language
- ISSN
- 1527-3342
1557-9581