Modulation Linearity Characterization of Si Mach-Zehnder Modulators
- Resource Type
- Periodical
- Authors
- Seong, M.; Ji, Y.; Im, C.; Bae, Y.; Choi, W.
- Source
- Journal of Lightwave Technology J. Lightwave Technol. Lightwave Technology, Journal of. 42(6):1901-1909 Mar, 2024
- Subject
- Communication, Networking and Broadcast Technologies
Photonics and Electrooptics
Silicon
Linearity
Electrodes
Optical waveguides
Junctions
Phase shifters
Modulation
Intermodulation distortion
Microwave photonics
Modulation linearity
Si Mach-Zehnder modulators
Spurious free dynamic range
- Language
- ISSN
- 0733-8724
1558-2213
Linearity of Si Mach-Zehnder Modulators (MZM) is characterized with a newly-proposed modeling technique which includes the influences of the transmission characteristics of traveling-wave (TW) electrodes and the electro-optic (EO) characteristics of PN junction phase shifters within Si MZMs. Using the technique, the third-order intermodulation distortion (IMD3) and the spurious-free dynamic range (SFDR) of a sample Si MZM device are determined, and their accuracy is verified with measurement results. In addition, the contributions of different nonlinear parameters to the nonlinearity of the sample Si MZM are identified.