The Dual-Rasp Sampling System for an Enceladus Lander
- Resource Type
- Conference
- Authors
- Backes, Paul; Moreland, Scott; Badescu, Mircea; Riccobono, Dario; Brinkman, Alex; Choukroun, Mathieu; Molaro, Jamie; Aggerwal, Rajan; Newbold, Timothy; Ahmad, Adeel; Ubellacker, Samuel
- Source
- 2020 IEEE Aerospace Conference Aerospace Conference, 2020 IEEE. :1-9 Mar, 2020
- Subject
- Aerospace
Communication, Networking and Broadcast Technologies
Components, Circuits, Devices and Systems
Computing and Processing
Engineering Profession
Robotics and Control Systems
Signal Processing and Analysis
Sea surface
Saturn
Conferences
Moon
Prototypes
Aerospace materials
Gravity
- Language
The Dual-Rasp sampling system has been developed for the unique sampling environment of a lander mission to the surface of Saturn's moon Enceladus. Plume material from the subsurface ocean that has fallen to the surface is desired resulting in an objective to sample the topmost layer of icy material. The low gravity and potential large range of surface properties are challenges for the sampling system. The Dual-Rasp sampling system has two counter-rotating rasp cutters with teeth that remove material that is thrown up between the cutters. Two prototypes of the Dual-Rasp sampling system were built and tested, one with a carousel and one that uses pneumatics for sample transfer.