Study of Inter-Power Domain Failures during a CDM Event
- Resource Type
- Conference
- Authors
- Troussier, Chloe; Bourgeat, Johan; Simeu, Emmanuel; Arnould, Jean-Daniel; Jimenez, Jean; Jacquier, Blaise
- Source
- 2020 42nd Annual EOS/ESD Symposium (EOS/ESD) EOS/ESD Symposium (EOS/ESD), 2020 42nd Annual. :1-5 Sep, 2020
- Subject
- Aerospace
Communication, Networking and Broadcast Technologies
Components, Circuits, Devices and Systems
Computing and Processing
Engineered Materials, Dielectrics and Plasmas
Engineering Profession
Fields, Waves and Electromagnetics
General Topics for Engineers
Power, Energy and Industry Applications
Signal Processing and Analysis
Semiconductor device measurement
Simulation
Logic gates
Silicon
Data models
Substrates
Testing
- Language
This work introduces a study of inter power domain failures during a CDM event. A comprehensive simulation is developed, using substrate and package modeling as well as VF-TLP characterization of CDM protections and oxide breakdown study in the CDM timescale. Simulation results are compared with silicon testing.