在物联网设备进行高、低温试验时,为了让设备内部温度达到稳定条件需要将设备在高、低温条件下保持数小时,但是在常用的标准中并未给出所需要保持的时间周期,这就造成了可能会造成设备试验不充分带来的风险.本文提出了一种设备内部温度测量方法,通过设备内部温度测量从而来确定在高低温下所需要的时间,并以一种设备为例给出了具体的测试步骤和方法.
To ensure the stability of internal temperature,IoT devices undergo prolonged high and low-temperature tests,necessitating hours of exposure to extreme temperatures.However,commonly used standards do not provide specific guidelines on the duration of storage,which may pose risks of insufficient testing for the devices.This paper proposes a method for measuring the internal temperature of devices to determine the required duration under high and low-temperature conditions.It provides specific testing procedures and methods using a particular device as an example.