Defect Structure of Nitrogen Doped Czochralski Silicon Annealed under Enhanced Pressure
- Resource Type
- Source
- Acta Physica Polonica A. 117:344-347
- Subject
Reciprocal lattice Materials science Silicon chemistry Infrared Analytical chemistry General Physics and Astronomy chemistry.chemical_element Nitrogen doped - Language
- ISSN
- 1898-794X
0587-4246