Deformation state extraction from electron backscatter diffraction patterns via simulation-based pattern-matching
- Resource Type
- Authors
- Christian Kurniawan; Chaoyi Zhu; Marc DeGraef
- Source
- Scripta Materialia. 190:147-152
- Subject
- 010302 applied physics
Materials science
Deformation (mechanics)
Mechanical Engineering
Metals and Alloys
02 engineering and technology
021001 nanoscience & nanotechnology
Condensed Matter Physics
01 natural sciences
Computational physics
Mechanics of Materials
Approximation error
Distortion
0103 physical sciences
General Materials Science
Pattern matching
Ideal (ring theory)
Tensor
0210 nano-technology
Rotation (mathematics)
Electron backscatter diffraction
- Language
- ISSN
- 1359-6462
A new simulation-based pattern-matching method is developed to retrieve the deformation tensor from electron backscatter diffraction patterns. Minimizing the least-squares difference between a target pattern and simulated deformed patterns, the deformation state of the target pattern can be inferred with an average absolute error of ∼ 10 − 8 for the distortion tensor under ideal conditions. The new approach is robust against significant pattern rotation compared to the cross-correlation based method. Additionally, the pattern center can be simultaneously optimized with an average absolute distortion tensor error of ∼ 10 − 4 for noise-free patterns.