Ab Initio Computational Screening and Performance Assessment of van der Waals and Semimetallic Contacts to Monolayer WSe2 P-Type Field-Effect Transistors
- Resource Type
- Source
- IEEE Transactions on Electron Devices. 70:2090-2097
- Subject
Electrical and Electronic Engineering Electronic, Optical and Magnetic Materials - Language
- ISSN
- 1557-9646
0018-9383