Wide area holographic microscopy by spatial phase scanning
- Resource Type
- Authors
- Myung K. Kim
- Source
- Imaging and Applied Optics Congress.
- Subject
- Quantitative phase microscopy
Materials science
business.industry
Image quality
Holography
Phase (waves)
Holographic interferometer
Holographic interferometry
law.invention
Optics
Wide area
law
Microscopy
business
- Language
Spatial phase scanning is introduced for wide area acquisition of quantitative phase microscopy. Both phase shifting and wide area acquisition is achieved by scaning the object across the tilted reference phase field of holographic interferometer.