SEMS and MAPS: recent developments in microstructure mapping
- Resource Type
- Authors
- J. Driver
- Source
- Revue de Métallurgie. 100:551-559
- Subject
- Engineering
Orientation (computer vision)
business.industry
Metals and Alloys
Crystal orientation
Context (language use)
Nanotechnology
Geometry
Condensed Matter Physics
Microstructure
Materials Chemistry
Physical and Theoretical Chemistry
business
Electron backscatter diffraction
- Language
- ISSN
- 1156-3141
0035-1563
Recent developments in Scanning Electron Microscopy (SEM) are reviewed paying particular attention to the modern tendency to determine quantitative data in the form of microstructure maps : of chemical composition (EDS and WDS), of crystal orientation (EBSD) and of the deformation (microextensometry). The maps are then used to provide complete, quantitative microstructural analyses in terms of the size, orientation and composition distributions. In this context the new SEM-FEGs have an important role to play.