The needs and challenges of electrical measurements for micro/nanoelectronic devices
- Resource Type
- Authors
- Gautier, Brice; Martin, Simon; Hourani, Wael; Grandfond, Antonin; BABOUX, Nicolas; Albertini, David
- Source
- Consultative Committee for Electricity and Magnetism workshop
Consultative Committee for Electricity and Magnetism workshop, Jan 2017, Paris, France
- Subject
- [PHYS]Physics [physics]
[PHYS.PHYS.PHYS-OPTICS] Physics [physics]/Physics [physics]/Optics [physics.optics]
[PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics]
[SPI.OPTI] Engineering Sciences [physics]/Optics / Photonic
[SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics
[SPI.OPTI]Engineering Sciences [physics]/Optics / Photonic
[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics
[SPI.MAT] Engineering Sciences [physics]/Materials
[SPI.MAT]Engineering Sciences [physics]/Materials
[PHYS] Physics [physics]
- Language
- English
23 mars 2017; International audience; no abstract