Single-Event Transient Case Study for System-Level Radiation Effects Analysis
- Resource Type
- Authors
- Kenneth A. LaBel; Hak Kim; Rebekah Austin; Raymond L. Ladbury; Michael J. Campola; Edward P. Wilcox; Jonathan A. Pellish
- Source
- IEEE Transactions on Nuclear Science. 68:1002-1007
- Subject
- Nuclear and High Energy Physics
010308 nuclear & particles physics
Computer science
Notation
01 natural sciences
Set (abstract data type)
Nuclear Energy and Engineering
Criticality
Control system
0103 physical sciences
Systems architecture
Transient (computer programming)
Sensitivity (control systems)
Electrical and Electronic Engineering
Simulation
Event (probability theory)
- Language
- ISSN
- 1558-1578
0018-9499
Analog single-event transient (SET) results are analyzed for two different applications within one system architecture. Application-specific analyses are presented on the MAX4595 commercial device using single-event effects criticality and goal structuring notation (GSN).