Characterization of defect levels in chemically deposited CdS films in the cubic-to-hexagonal phase transition.
- Resource Type
- Article
- Source
- Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films; 1997, Vol. 15 Issue 4, p2282-2286, 5p
- Subject
- Language
- ISSN
- 07342101