Test Methodology for Dual-rail Asynchronous Circuits.
- Resource Type
- Article
- Authors
- Kuan-Yen Huang; Ting-Yu Shen; Chien-Mo Li
- Source
- DAC: Annual ACM/IEEE Design Automation Conference; 2017, Issue 54, p427-432, 6p
- Subject
- ASYNCHRONOUS circuits
DIGITAL electronics
AUTOMATIC test pattern generation
PATTERN generators
PSYCHOLOGICAL feedback
- Language
- ISSN
- 0738100X
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