Study of the Within-Batch TID Response Variability on Silicon-Based VDMOS Devices.
- Resource Type
- Article
- Source
- Electronics (2079-9292); Mar2023, Vol. 12 Issue 6, p1403, 13p
- Subject
THRESHOLD voltage GAMMA rays STANDARD deviations METAL oxide semiconductor field-effect transistors - Language
- ISSN
- 20799292