Effect of Trapped Charge Induced by Total Ionizing Dose Radiation on the Top-Gate Carbon Nanotube Field Effect Transistors.
- Resource Type
- Article
- Source
- Electronics (2079-9292); Feb2023, Vol. 12 Issue 4, p1000, 14p
- Subject
CARBON nanotube field effect transistors IONIZING radiation FIELD-effect transistors TRANSISTORS CARBON nanotubes RADIATION doses - Language
- ISSN
- 20799292