OPTIMAL SAMPLING AND RECONSTRUCTION STRATEGIES FOR SCANNING MICROSCOPES.
- Resource Type
- Article
- Authors
- Browning, Nigel D.; Nicholls, Daniel; Wells, Jack; Robinson, Alex W.
- Source
- Electronic Device Failure Analysis. Feb2022, Vol. 24 Issue 1, p11-16. 6p.
- Subject
- *SCANNING transmission electron microscopy
*ELECTRONIC equipment
*ELECTRON optics
*ELECTRON energy loss spectroscopy
*MICROSCOPES
- Language
- ISSN
- 1537-0755
The article focuses on the OPTIMAL SAMPLING AND RECONSTRUCTION STRATEGIES FOR SCANNING MICROSCOPES. Topics discussed include the advent of aberration-corrected scanning transmission electron microscopy (STEM) has led to an unprecedented increase in the achievable spatial resolution from all forms of imaging and spectroscopy; and this has also been accompanied by a simultaneous increase in the operational probe current under typical imaging conditions.