We develop a compact, high signal-to-noise ratio line-detector array Compton scatter imaging system based on Y 2 SiO 5 scintillators and silicon photomultipliers. It is shown that the system's response uniformity is better than 98% for low-Z eff materials after a specific correction. Backscatter images of an "IHEP"-character model, cubes of different materials, and some other applications are presented, to show its potential for use in nondestructive testing. • A line-detector array based on SiPMs and YSO was developed. • Scintillation light loss and optical crosstalk were reduced. • Detector was applied to a Compton scatter imaging system. • A specific system response-uniformity correction was applied and discussed. • Backscatter images were presented to show its potential in NDT applications. [ABSTRACT FROM AUTHOR]