Non-contact bimodal magnetic force microscopy.
- Resource Type
- Article
- Authors
- Schwenk, J.; Marioni, M.; Romer, S.; Joshi, N. R.; Hug, H. J.
- Source
- Applied Physics Letters. 3/17/2014, Vol. 104 Issue 11, p1-4. 4p. 3 Diagrams, 1 Graph.
- Subject
- *MAGNETIC force microscopy
*STRUCTURAL optimization
*CANTILEVERS
*STIFFNESS (Engineering)
*SURFACE topography
*MAGNETISM
- Language
- ISSN
- 0003-6951
A bimodal magnetic force microscopy technique optimized for lateral resolution and sensitivity for small magnetic stray fields is discussed. A double phase-locked loop (PLL) system is used to drive a high-quality factor cantilever under vacuum conditions on its first mode and simultaneously on its second mode. The higher-stiffness second mode is used to map the topography. The magnetic force is measured with the higher-sensitivity first oscillation mode. [ABSTRACT FROM AUTHOR]