Multi-objective Optimization Hardening Design for Multiplier Circuit
- Resource Type
- Conference
- Authors
- Chen, Chao; Li, Yan; Cheng, Xu; Han, Jun; Zeng, Xiaoyang
- Source
- 2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT) Solid-State & Integrated Circuit Technology (ICSICT), 2022 IEEE 16th International Conference on. :1-3 Oct, 2022
- Subject
- Components, Circuits, Devices and Systems
Integrated circuit technology
Power demand
Error analysis
Clustering algorithms
Circuit synthesis
Bayes methods
Reliability
- Language
Soft error has been a major reliability issue in advanced technology nodes. Mitigating soft error rate (SER) will bring great area and power overhead inevitably. This paper makes several improvements to a multi-objective optimization framework based on Bayesian optimization. A scheme incorporating Affinity Propagation (AP) and a novel sorting algorithm is proposed to cluster and sort the flip-flops (FFs), which ensures that the framework is suitable for large-scale circuit design. Results show that the scheme proposed in this paper performs better than the reference work. By employing the framework on multiplier hardening designs, a 78.3% reduction in SER is achieved with an acceptable increase in area and power consumption.