Characterization of 3-port SAW diplexers using 2-port VNA measurements
- Resource Type
- Conference
- Authors
- Bunea, A.C.; Neculoiu, D.; Dinescu, M.A.
- Source
- 2022 International Semiconductor Conference (CAS) Semiconductor Conference (CAS), 2022 International. :81-84 Oct, 2022
- Subject
- Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Photonics and Electrooptics
Power dividers
Semiconductor device measurement
Surface impedance
Surface acoustic waves
Delay lines
Transmission line measurements
Scattering parameters
diplexer
S-parameters
scandium alluminum nitride
surface acoustic wave
Z-parameters
- Language
- ISSN
- 2377-0678
A simple approach to the on-wafer characterization of 3-port surface acoustic wave (SAW) diplexers using S- to Z- parameter conversion is proposed. The concept is first tested on a simple power divider model. The model is based on ideal transmission line elements and open circuit blocks. The results are excellent with total S-parameter errors below 10 −9 • The technique is then successfully applied to X-band delay line type 3-port SAW circuits connected using 50 Ohm characteristic impedance coplanar waveguide (CPW) transmission lines.