Laser-Induced Micro SEL Characterization of SRAM Devices
- Resource Type
- Conference
- Authors
- Yingqi, Ma; Jianwei, Han; Shipeng, Shangguan; Xiang, Zhu; Rui, Chen
- Source
- 2019 IEEE Radiation Effects Data Workshop Radiation Effects Data Workshop, 2019 IEEE. :1-3 Jul, 2019
- Subject
- Aerospace
Components, Circuits, Devices and Systems
Nuclear Engineering
Photonics and Electrooptics
COTS
Micro SEL
Pulsed Laser
Backside
Hardness Assurance
- Language
This paper presents micro single event latch-up characterization of SRAM by laser backside testing. The SEL threshold and the detailed micro SEL features have been investigated by laser automatic scanning experiment. The micro SEL results can give the reference for the hardness assurance in circuit system level.