Assessment of reliability impact on GHz processors with moderate overdrive
- Resource Type
- Conference
- Authors
- Igarashi, Mitsuhiko; Aono, Hideki; Abe, Hideaki; Shibutani, Koji; Takeuchi, Kan
- Source
- Fifteenth International Symposium on Quality Electronic Design Quality Electronic Design (ISQED), 2014 15th International Symposium on. :456-460 Mar, 2014
- Subject
- Aerospace
Bioengineering
Communication, Networking and Broadcast Technologies
Components, Circuits, Devices and Systems
Photonics and Electrooptics
Power, Energy and Industry Applications
Human computer interaction
Degradation
Power demand
Reliability engineering
Stress
Correlation
Reliability
xBTI
guard-band
AC-HCI
low-power
overdrive
- Language
- ISSN
- 1948-3287
1948-3295
Moderate overdrive of the supply voltage rather reduces total powers at high temperatures, which enables GHz design overcoming thermal runaway. We have examined the way in which reliability issues such as negative bias temperature instability (NBTI) and hot carrier injection (HCI) affect the product performance. 1) The high temperature and voltage acceleration test on 45nm products has revealed that NBTI variations have small impacts on the amount of the voltage guard-band which is set at the product testing to prevent the wear-out failures in advance. 2) The increase in the voltage guard-band by using moderate overdrive is small enough compared to the amount of moderate overdrive voltage. 3) The HCI AC-to-DC ratio is expected to increase as the process scaling proceeds, making the HCI less influential. These aspects enable low-power and reliable GHz design utilizing moderate overdrive.